A New Approach for Residual Stress Analysis of GH3535 Alloy by Using Two-Dimensional Synchrotron X-Ray Diffraction
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作者
MECHANICAL-PROPERTIES; THIN-FILMS; MICROSTRUCTURE; COATINGS
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刊物名称
Chin. Phys. Lett.
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年、卷、文献号
2020, 37, 70701
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关键词
MECHANICAL-PROPERTIES; THIN-FILMS; MICROSTRUCTURE; COATINGS
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摘要
We propose a new method to evaluate residual stress based on the analysis of a portion of a Debye ring with two-dimensional synchrotron x-ray diffraction. The residual stress of a nickel-based alloy GH3535 evaluated by the proposed method is determined to be - 1149 +/- 34 MPa based on the quantitative analysis of the deformation of the (200) reflection, and the residual stress obtained by analyzing THE (111) plane is -933 +/- 68 MPa. The results demonstrate that the GH3535 alloy surface is highly compressive, as expected for a polishing surface treatment. The proposed method provides insight into the field of residual stress measurement and quantitative understanding of the residual stress states in GH3535.
